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Dispersion and relaxation in the stress‐induced birefringence of amorphous selenium
Author(s) -
Yu P. Y.,
Cardona M.
Publication year - 1971
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2220470132
Subject(s) - birefringence , relaxation (psychology) , isotropy , amorphous solid , stress relaxation , materials science , dispersion (optics) , wavelength , stress (linguistics) , condensed matter physics , optics , composite material , chemistry , physics , crystallography , optoelectronics , creep , psychology , social psychology , linguistics , philosophy
The stress‐induced birefringence (or piezobirefringence) of amorphous Se has been measured at room temperature for wavelengths between 1.15 and 0.77 μm. A ‘bond model’ is proposed to explain the long‐wavelength photoelastic properties of this material. The dispersion in the piezobirefringence was fitted to the two‐parameter phenomenological expression of Wemple and DiDomenico. The relaxation of the piezobirefringence under constant stress, and the recovery of the isotropy after return to zero stress have also been measured at room temperature. From the relaxation curves the birefringence relaxation time for the last Maxwellian element has been determined.