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Determination of structure factors of X‐rays using half‐widths of the Bragg diffraction curves from perfect single crystals
Author(s) -
Kikuta S.
Publication year - 1971
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2220450138
Subject(s) - diffractometer , perfect crystal , bragg's law , diffraction , reflection (computer programming) , silicon , optics , radiation , crystal (programming language) , materials science , single crystal , physics , computational physics , crystallography , chemistry , bent molecular geometry , scanning electron microscope , computer science , metallurgy , composite material , programming language
For determining precisely the absolute values of X‐ray atomic scattering factors ( f ‐values) the half‐widths of the Bragg diffraction curves of perfect single crystals are utilized. The principle of the method and the experimental procedure are described. Using a double‐crystal diffractometer of parallel setting with CuKα 1 radiation, the f ‐value for the 422 reflection of silicon was determined with an accuracy better than 0.3% in a favourable case, which is in good agreement with the theoretical one. Even strongly absorbing crystals can be used as specimens, a size of the perfect region of about 0.5 mm will be sufficient for the measurements. The present method seems to be promising.