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Temperature‐modulated reflectance of GaSe at the ground state exciton line
Author(s) -
Balzarotti A.,
Grandolfo M.,
Somma F.,
Vecchia P.
Publication year - 1971
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2220440230
Subject(s) - exciton , liquid nitrogen , reflectivity , ground state , line (geometry) , spectral line , atomic physics , materials science , analytical chemistry (journal) , chemistry , condensed matter physics , optics , physics , quantum mechanics , geometry , mathematics , organic chemistry , chromatography
Thermoreflectance spectra in the exciton region were obtained on the layer compound GaSe. The experimental results can be explained by assuming that the only temperature effect is a shift of the whole structure. At liquid nitrogen temperature the values E o = 2.093 eV and T = 41.0 meV are found for the first energy level and the broadening parameter, respectively. Measurements at three different temperatures gave the value d E 0 /d T = −5.49 × 10 −4 eV/deg for the temperature coefficient.
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