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Theory of Plasma Electroreflectance of Light from Semiconductors
Author(s) -
Dmitruk N. L.,
Tyagai V. A.
Publication year - 1971
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2220430213
Subject(s) - plasma , debye length , semiconductor , reflection (computer programming) , field (mathematics) , materials science , reflection coefficient , optics , condensed matter physics , chemistry , optoelectronics , physics , mathematics , quantum mechanics , computer science , pure mathematics , programming language
A calculation of the influence of the surface field on the plasma reflection coefficient (plasma electroreflectance) is presented. It is shown that the field and spectral dependences of plasma electroreflectance are significant for the determination of a considerable number of semiconductor parameters (that of free carriers, surface parameters, etc.). An oscillatory behaviour of the plasma electroreflectance is predicted when the Debye screening length is small enough with respect to the spatial inhomogeneity length of the light wave.