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High‐Frequency Contactless Characterization of 2D Materials. Graphene, WS 2
Author(s) -
Arcos David,
Nuño Daniel,
Santos Maria C.,
Ametller Lluís,
Ferrer-Anglada Núria
Publication year - 2020
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.202000476
Subject(s) - terahertz radiation , materials science , resonator , graphene , conductivity , surface conductivity , optoelectronics , dielectric , characterization (materials science) , rutile , electrical resistivity and conductivity , optics , nanotechnology , chemistry , physics , quantum mechanics , organic chemistry
The electrical conductivity of two‐dimensional (2D) materials without any electrical contact can be obtained using two different methods: the terahertz time domain spectroscopy (THz‐TDS) method, in the range from GHz up to 2 THz, and with a rutile dielectric resonator (RDR), in which case the conductivity is obtained at the resonant frequency of the device, close to 9.0 GHz. In one case (THz‐TDS in a transmission setup), the sample is directly focused. In the other case (RDR), the sample is placed inside the resonant cavity working atTE 011mode and must have exactly the same surface size as the cavity, 12 × 12 mm in our device. From the Q factor variation of the resonant cavity due to the sample, its surface resistance is extracted. These measurements are performed on different 2D materials: graphene andWS 2 . Both methods are analyzed and compared. For few‐layer 2D samples, the THz‐TDS method is suitable.