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Contactless Electrical Resistance of 2D Materials Using a Rutile Resonator
Author(s) -
Arcos David,
Krkotić Patrick,
O'Callaghan Joan M.,
Pont Montse,
Ametller Lluís,
Ferrer-Anglada Núria
Publication year - 2019
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.201900428
Subject(s) - graphene , materials science , rutile , chemical vapor deposition , electrical resistivity and conductivity , substrate (aquarium) , oxide , graphene oxide paper , polyethylene terephthalate , electrical contacts , electrical resistance and conductance , contact resistance , sheet resistance , composite material , nanotechnology , brass , dielectric , quartz , optoelectronics , chemical engineering , metallurgy , layer (electronics) , copper , oceanography , electrical engineering , geology , engineering
Measuring the electrical surface resistance of 2D materials without contact can provide a method for obtaining their intrinsic characterization. Herein, the aim is to show that a rutile dielectric resonator (RDR) can be used to measure the electrical surface resistance of conducting coatings deposited on substrates, at the resonance frequency. Moreover, it is known that the substrate exerts a strong influence capable of intrinsically modify the properties of 2D materials, as found in graphene. The RDR method is used for different samples of metals (Cu, Mo, Ti, and brass), carbon nanotubes (bucky paper), a film of compacted graphene flakes, a film of compacted graphene oxide flakes, and graphene obtained by chemical vapor deposition (CVD) on different substrates (SiO 2 /Si, quartz, and polyethylene terephthalate [PET]). The results show that reasonable values can be obtained for thin conducting materials with a thickness of not less than a few micrometers. In the case of graphene grown on a substrate, the presence of graphene is clearly detected but the resistivity value cannot be extracted.