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Defect Parameters Contour Mapping: A Powerful Tool for Lifetime Spectroscopy Data Analysis (Phys. Status Solidi B 8/2018)
Author(s) -
Bernardini Simone,
Naerland Tine U.,
Coletti Gianluca,
Bertoni Mariana I.
Publication year - 2018
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.201870130
Subject(s) - limiting , a priori and a posteriori , identification (biology) , computer science , visualization , characterization (materials science) , data mining , task (project management) , algorithm , materials science , engineering , systems engineering , nanotechnology , mechanical engineering , philosophy , botany , epistemology , biology
The correct identification of lifetime limiting impurities in silicon for photovoltaic application is often a problematic task, despite the many characterization techniques available in most research laboratories. In article no. 1800082 , Bernardini et al. examine in detail the recently introduced defect parameters contour mapping (DPCM) methodology to evaluate temperature‐ and injection‐dependent lifetime spectroscopy data as a tool for direct visualization of lifetime limiting defects. Herein, the authors showcase the DPCM method's potential by applying it to two representative case studies selected from literature and they demonstrate that, even when experimental data are scarce, invaluable information are obtained in an easy and intuitive way without making any a priori assumption. Furthermore, the authors evaluate the limits of the proposed approach and show that when compared to other existing analysis frameworks, the DPCM method shows remarkable versatility and greatly simplifies the identification of possible lifetime limiting defects.