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Local Structure Measurement Around Light Elements by Using Inverse Photoelectron Holography
Author(s) -
Yamamoto Yuta,
Kimura Koji,
Ang Artoni K. R.,
Matsushita Tomohiro,
Hayashi Kouichi
Publication year - 2018
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.201800141
Subject(s) - holography , electron holography , inverse , optics , x ray photoelectron spectroscopy , materials science , electron , resolution (logic) , physics , nuclear magnetic resonance , computer science , geometry , mathematics , nuclear physics , artificial intelligence
The inverse mode of photoelectron holography (PEH) has a variety of major benefits compared with other atomic‐resolution holography techniques. One of the most significant is the ability to record holograms from emissions of light elements. We measured the O K α holograms of Nb‐doped SrTiO 3 using 1.5 and 20.0 keV incident electron beams and observed the differences in the holograms and atomic images between two different energies.