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Nanoscale Characterization of Individual Horizontally Aligned Single‐Walled Carbon Nanotubes
Author(s) -
Németh Gergely,
Datz Dániel,
Tóháti Hajnalka Mária,
Pekker Áron,
Otsuka Keigo,
Inoue Taiki,
Maruyama Shigeo,
Kamarás Katalin
Publication year - 2017
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.201700433
Subject(s) - carbon nanotube , materials science , characterization (materials science) , nanoscopic scale , nanotechnology , near field scanning optical microscope , optical properties of carbon nanotubes , nanotube , image resolution , fabrication , signal (programming language) , resolution (logic) , optical microscope , optics , optoelectronics , scanning electron microscope , computer science , composite material , physics , medicine , alternative medicine , pathology , artificial intelligence , programming language
One of the most challenging tasks in nanotube research is to identify the different electronic types of nanotubes for device fabrication. The implementation of standard spectroscopy techniques at the single‐tube level has remained a great task due to small nanotube signal and low spatial resolution. Scattering‐type scanning near‐field optical microscopy (s‐SNOM) yields information on the optical characteristics of the sample with high spatial resolution. We have already demonstrated that this method is able to distinguish between different electronic types of carbon nanotube bundles based on their optical properties in the infrared region. Now we applied the same method to characterize individual horizontally aligned single‐walled carbon nanotubes (SWCNTs).