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Analysis of Point Defects in Graphene Using Low Dose Scanning Transmission Electron Microscopy Imaging and Maximum Likelihood Reconstruction
Author(s) -
Kramberger Christian,
Mittelberger Andreas,
Hofer Christoph,
Meyer Jannik C.
Publication year - 2017
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.201700176
Subject(s) - graphene , crystallographic defect , materials science , electron , transmission electron microscopy , electron beam processing , irradiation , high resolution transmission electron microscopy , electron microscope , population , scanning electron microscope , resolution (logic) , optics , molecular physics , nanotechnology , optoelectronics , physics , nuclear magnetic resonance , computer science , artificial intelligence , composite material , nuclear physics , demography , sociology
Freestanding graphene displays an outstanding resilience to electron irradiation at low electron energies. Point defects in graphene are, however, subject to beam driven dynamics. This means that high resolution micrographs of point defects, which usually require a high electron irradiation dose might not represent the intrinsic defect population. Here, we capture the initial defects formed by ejecting carbon atoms under electron irradiation, by imaging with very low doses and subsequent reconstruction of the frequently occuring defects via a maximum likelihood algorithm.