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Avoiding arbitrarily wrong microluminescence statistics due to a non‐quantitatively calibrated setup
Author(s) -
Sträter Hendrik,
Nilius Niklas,
Brüggemann Rudolf
Publication year - 2017
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.201600761
Subject(s) - formalism (music) , calibration , photon , standard deviation , computational physics , physics , fermi gamma ray space telescope , semiconductor , optics , condensed matter physics , statistics , mathematics , optoelectronics , quantum mechanics , art , musical , visual arts
Photoluminescence (PL) measurements on the μ m scale are a powerful tool to examine thin film semiconductors with respect to lateral inhomogeneities of their opto‐electronic properties. For practical reasons, the determination of the standard deviation of the laterally resolved splitting of quasi‐Fermi levels (QFL) is often performed with an experimental setup that only has been calibrated spectrally but not with respect to the quantitatively emitted photon flux. We show that the omission of the absolute PL photon flux can lead to arbitrarily wrong distributions of the QFL‐splitting and correlations between the QFL‐splitting and other opto‐electronic properties. For a better understanding, we present a algebraical formalism of the dependence on the absolute calibration and demonstrate the effect of a wrong calibration using two different thin film absorbers. Finally, a method to estimate the true statistics with sufficient accuracy is presented.