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Defect‐induced electrostatic charging of nitrogen films
Author(s) -
Savchenko Elena,
Khyzhniy Ivan,
Uyutnov Sergey,
Bludov Mikhail,
Gumenchuk Galina,
Bondybey Vladimir
Publication year - 2016
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.201600406
Subject(s) - cathodoluminescence , exoelectron emission , electron , analytical chemistry (journal) , materials science , luminescence , atomic physics , yield (engineering) , cathode ray , range (aeronautics) , quantum yield , electrode , chemistry , optoelectronics , fluorescence , optics , physics , chromatography , quantum mechanics , metallurgy , composite material
Electrostatic charging of nanostructured N 2 films was studied employing optical and a current set of emission spectroscopy methods: cathodoluminescence CL, thermally and photon‐stimulated exoelectron emission TSEE, PSEE as well as thermally and photon‐stimulated luminescence TSL, PSL. Concurrently with thermally stimulated yield of electrons the yield of nitrogen particles was detected, so‐called “postdesorption.” An enhancement of the optical emission stemmed from the neutralization reaction N 4 + + e → N 2 * + N 2 * → N 2 + N 2 + hν was observed with an exposure to an electron beam. The experiments performed with a variable voltage applied to an electrode for current detection demonstrated significant accumulation of negative charge. The TSEE current in the low‐temperature range was detected at negative voltages up to −30 V. An accumulation of trapped electrons (up to 10 16 cm −3 ) was detected. A possible contribution of N 3 − in electrostatic charging was assumed. Thermally stimulated yield of negatively charged particles from a N 2 film subjected to an electron beam.