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Near infrared to ultraviolet anisotropic optical properties of single crystal SrLaAlO 4 from spectroscopic ellipsometry
Author(s) -
Adhikari Dipendra,
Junda Maxwell M.,
Uprety Prakash,
Ghimire Kiran,
Subedi Indra,
Podraza Nikolas J.
Publication year - 2016
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.201600286
Subject(s) - materials science , refractive index , ellipsometry , birefringence , anisotropy , optics , infrared , spectral line , single crystal , ultraviolet , analytical chemistry (journal) , molecular physics , chemistry , optoelectronics , crystallography , physics , thin film , chromatography , astronomy , nanotechnology
The anisotropic optical properties of single crystal SrLaAlO 4 are investigated using spectroscopic ellipsometry over the range from 0.74 to 5.90 eV. Divided spectral range analysis of ellipsometric and Mueller matrix spectra are used to obtain the sample structural parameters (surface roughness thickness and void fraction). The ordinary and extra‐ordinary optical properties in the form of complex dielectric function, ϵ  =  ϵ 1  + i ϵ 2 (or complex index of refraction, N  =  n  + i k ), spectra are extracted from the same analysis. The observed birefringence is ∼ 0.025 in the transparent range. An upper limit for the indirect gap at 3.01 ± 0.01 eV and a critical point at 5.54 ± 0.01 eV are identified within the measured spectral range.

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