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Influence of the lattice mismatch strain on the surface morphology of ZnMgTe/ZnTe/ZnMgTe electro‐optical waveguide structure
Author(s) -
Kazami Fukino,
Sun WeiChe,
Taguri Kosuke,
Nakasu Taizo,
Aiba Takayuki,
Yamashita Sotaro,
Hattori Shota,
Kizu Takeru,
Kobayashi Masakazu,
Asahi Toshiaki
Publication year - 2016
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.201552587
Subject(s) - cladding (metalworking) , materials science , waveguide , surface roughness , optics , surface finish , molecular beam epitaxy , lattice (music) , optical microscope , epitaxy , dislocation , morphology (biology) , optoelectronics , composite material , layer (electronics) , scanning electron microscope , physics , biology , acoustics , genetics
ZnMgTe/ZnTe waveguide is a high potential electro‐optical device. Thick and high Mg composition cladding layers are required for high optical performance waveguides. However, adding Mg would increase the lattice mismatch between ZnMgTe and ZnTe which would cause dislocation defects and generate asperities at interfaces. In this article, influence of the lattice mismatch strain to the waveguide surface morphology was studied. Waveguide structures were prepared by molecular beam epitaxy. The surface morphologies were observed using atomic force microscope and propagation loss of the waveguides were studied. Total of 0.5–0.7 μm asperities were observed on the surface of waveguides with 20% of Mg composition and 1.2 μm of the total cladding layer thickness. The asperities on the surface became larger (1.0–1.2 μm) when the Mg composition increased to 40%. The propagation loss of the waveguide was suppressed to 7 dB by tuning the growth parameters and the resulting interface roughness.
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