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Structural studies on TlInSe 2 thermoelectric material by X‐ray fluorescence holography, XAFS, and X‐ray diffraction
Author(s) -
Hosokawa Shinya,
Kamimura Kenji,
Ikemoto Hiroyuki,
Happo Naohisa,
Mimura Kojiro,
Hayashi Kouichi,
Takahashi Kohki,
Wakita Kazuki,
Mamedov Nazim
Publication year - 2015
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.201400247
Subject(s) - x ray absorption fine structure , diffraction , thermoelectric effect , holography , materials science , x ray , fluorescence , x ray crystallography , interference (communication) , position (finance) , crystal structure , crystallography , chemistry , optics , physics , spectroscopy , thermodynamics , channel (broadcasting) , electrical engineering , quantum mechanics , engineering , finance , economics
Abstract The local structure around the Tl atoms in TlInSe2 thermoelectric material was investigated by X‐ray fluorescence holography (XFH), XAFS, and X‐ray diffraction (XD). The temperature dependent XAFS and XD data reveal that no distinct phase change features are found, and the position of the Tl atoms are fluctuated randomly in the Tl chain direction of the crystal, which is consistent with the XFH result at room temperature. Also, an interference between the positions of Tl and In atoms is suggested by all of these experiments.