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Synthesis and characterization of Pt/ MWCNT s nanocomposites
Author(s) -
DobrzańskaDanikiewicz Anna D.,
Łukowiec Dariusz
Publication year - 2013
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.201300083
Subject(s) - nanocomposite , materials science , platinum , platinum nanoparticles , carbon nanotube , scanning electron microscope , transmission electron microscopy , nanoparticle , raman spectroscopy , nanotechnology , chemical engineering , amorphous solid , amorphous carbon , characterization (materials science) , chemical vapor deposition , composite material , catalysis , chemistry , crystallography , organic chemistry , engineering , physics , optics
Nanocomposite materials containing carbon nanotubes (CNTs) coated with platinum nanoparticles were fabricated as part of the investigations undertaken. The purpose of the works was the multifaceted characterization of the materials produced including examination of the structure, morphology, assessment of platinum nanoparticles distribution on the surface of CNTs and determination of the average size of platinum crystals. High quality multiwalled CNTs with the length of 100–200 μm and diameter of 10–20 nm obtained in chemical vapor deposition were used in the investigations. Raw nanotubes did not contain metallic impurities or amorphous carbon deposits. An indirect method of bonding the earlier produced platinum nanoparticles to the surface of functionalized CNTs was employed to deposit platinum nanoparticles onto the surface of CNTs. Nanocomposite materials containing CNTs coated with platinum nanoparticles with a 5% weight fraction were obtained as part of the experiments made. The following research techniques were employed during the investigations aimed at recognizing the structure and morphology of the nanocomposites obtained: transmission electron microscopy, scanning transmission electron microscopy, scanning electron microscopy, Raman spectroscopy, and X‐ray structure analysis (XRD).