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Back Cover: Stability of 71° stripe domains in epitaxial BiFeO 3 films upon repeated electrical switching (Phys. Status Solidi B 11/2012)
Author(s) -
Johann Florian,
Morelli Alessio,
Vrejoiu Ionela
Publication year - 2012
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.201290029
Subject(s) - multiferroics , ferroelectricity , materials science , epitaxy , condensed matter physics , heterojunction , fabrication , thin film , plane (geometry) , electric field , domain (mathematical analysis) , magnetization , optoelectronics , nanotechnology , magnetic field , mathematics , physics , layer (electronics) , geometry , medicine , alternative medicine , pathology , dielectric , mathematical analysis , quantum mechanics
The 71° stripe domain patterns of epitaxial multiferroic BiFeO 3 thin films are being explored to achieve new functional properties, dissimilar from the BiFeO 3 bulk properties. For example, the employment of BiFeO 3 films with 71° domain patterns was reported for electric‐field induced reversal of the magnetization in CoFe/BiFeO 3 heterostructures. In their article on pp. 2278–2286 , Johann et al. address the stability of these ferroelectric domain patterns under repeated electrical switching. This is an essential issue if BiFeO 3 is considered to be used in device fabrication. The authors show that in‐plane switching and out‐of‐plane switching of these domains behave very differently. In the in‐plane configuration the domains are very stable, whereas in the out‐of‐plane configuration the domains change their size and patterns, depending on the applied switching voltage frequency.