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Inside Back Cover: Micro reflectance difference techniques: Optical probes for surface exploration (Phys. Status Solidi B 6/2012)
Author(s) -
LastrasMartínez L. F.,
del PozoZamudio O.,
HerreraJasso R.,
UlloaCastillo N.A.,
BalderasNavarro R.E.,
OrtegaGallegos J.,
LastrasMartínez A.
Publication year - 2012
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Reports
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.201290013
Subject(s) - cover (algebra) , laser , optics , materials science , reflectivity , diamond , abrasive , surface (topology) , measure (data warehouse) , spectral line , analytical chemistry (journal) , physics , chemistry , geometry , mathematics , composite material , computer science , mechanical engineering , engineering , chromatography , database , astronomy
The development of reflectance difference (RD/RA) spectroscopy as a powerful optical probe for characterizing surfaces and interfaces has suggested that an extension to microscopic scale (micro‐RD) could further increase the potential of the technique. In their article on pp. 1119–1123 , Lastras‐Martínez et al. compare and discuss the performance of two setups used to measure micro‐RD. One is based on a charge‐coupled device as light detector and the other on a laser and XY‐stage. The performance of both setups was tested by measuring the micro‐RD spectra of an n‐type GaSb (001) sample, which was slightly rubbed with a diamond abrasive compound along either [110] or [1‐10] directions. The cover shows micro‐RD spectra (right image, open circles) across the surface of GaSb (001) after the generation of directional strains along [1‐10]. Top left, a surface strain map obtained from fitting the amplitudes is shown, and the lower‐left image presents a result using the laser‐based set‐up.