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Infrared phonon modes and dielectric properties of La 2 Zr 2 O 7 : Comparing thin film to bulk material
Author(s) -
Cheng Xuerui,
Qi Zeming,
Li Tingting,
Zhang Guobin,
Li Chengxiang,
Zhou Hongjun,
Wang Yuyin,
Yin Min
Publication year - 2012
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.201147313
Subject(s) - dielectric , phonon , thin film , infrared , materials science , condensed matter physics , infrared spectroscopy , analytical chemistry (journal) , optics , chemistry , physics , optoelectronics , nanotechnology , organic chemistry , chromatography
The infrared phonon modes and dielectric constants of bulk and thin film of La 2 Zr 2 O 7 are studies by infrared spectroscopy. The infrared response of the La 2 Zr 2 O 7 bulk sample is determined by seven infrared phonon modes. The obtained static dielectric constant is 22.8 and the largest contribution is from the phonon modes at 213.7 and 352.7 cm −1 . Compared to the bulk sample, the obtained dielectric constant of the La 2 Zr 2 O 7 thin film shows an obvious decrease. The loss of the dielectric constant is due to the absence and weakness of some phonon modes in the thin film, even though it still preserves two important modes, mentioned above. The result indicates that the disorder in the La 2 Zr 2 O 7 thin film has an important influence on the dielectric property.