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Phenomenological quantum confinement models for excitons and phonons applied to photoluminescence and Raman spectra of silicon nanocrystals
Author(s) -
Dossot M.,
Miska P.,
Rinnert H.,
Vergnat M.,
Humbert B.
Publication year - 2011
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.201100089
Subject(s) - photoluminescence , raman spectroscopy , materials science , phonon , silicon , exciton , substrate (aquarium) , quantum dot , nanocrystal , amorphous solid , amorphous silicon , phenomenological model , nanocrystalline silicon , molecular physics , optoelectronics , condensed matter physics , crystalline silicon , nanotechnology , optics , crystallography , physics , chemistry , oceanography , geology
The photoluminescence and vibrational properties of silicon nanocrystals are studied in a multilayered system elaborated by successive evaporations of SiO and SiO 2 layers with controlled thicknesses. The multilayer systems are deposited on a glass substrate (Herasil). The photoluminescence and Raman spectra are fitted by phenomenological exciton and phonon confinement models accounting for the size distribution of the embedded nanocrystals. Contrary to the same study realized with multilayer systems deposited on silicon substrate, the two confinement models (phononic and excitonic) do not lead to the same size distribution. An amorphous silicon phase was also detected in Raman spectroscopy that prevented a good fitting accuracy by the model. Contribution of the substrate to the thermal crystallization process is thus discussed, as well as the origin of the photoluminescence and vibrational properties in terms of quantum confinement or interfacial defects.