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Photon‐in photon‐out soft X‐ray spectroscopy for materials science
Author(s) -
Himpsel F. J.
Publication year - 2011
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.201046212
Subject(s) - spectroscopy , x ray absorption spectroscopy , soft x ray emission spectroscopy , photon , absorption spectroscopy , x ray spectroscopy , nanomaterials , absorption (acoustics) , materials science , emission spectrum , scattering , resonant inelastic x ray scattering , inelastic scattering , atomic physics , optoelectronics , physics , optics , time resolved spectroscopy , nanotechnology , spectral line , inelastic neutron scattering , quantum mechanics , astronomy
A brief overview of the three elements of photon‐in photon‐out spectroscopy is given, i.e ., X‐ray absorption spectroscopy (XAS), X‐ray emission spectroscopy (XES), and resonant inelastic X‐ray scattering (RIXS). Key features are emphasized, such as element selectivity and the ability to study electronic states in dilute systems, at buried interfaces, and in a liquid environment. Characteristic applications in the areas of nanomaterials, biomaterials, and photovoltaic materials illustrate these capabilities.