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Al‐doped ZnO nanofilms: Synthesis and characterization
Author(s) -
Huczko A.,
Dąbrowska A.,
Madhup D. K.,
Subedi D. P.,
Chimouriya S. P.
Publication year - 2010
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.201000164
Subject(s) - band gap , doping , materials science , scanning electron microscope , analytical chemistry (journal) , substrate (aquarium) , spectroscopy , energy dispersive x ray spectroscopy , thin film , dispersion (optics) , diffraction , nanotechnology , optoelectronics , optics , chemistry , composite material , oceanography , physics , chromatography , quantum mechanics , geology
Al‐doped and un‐doped ZnO nanofilms on quartz substrate were obtained by ultrasonic spray pyrolysis of salt solutions (mole concentration of Al within 0–10%). The films were characterized by Scanning electron microscopy (SEM), X‐ray diffraction (XRD), Atomic force microscopy (AFM) and UV spectroscopy to study the morphology and optical properties. The optical studies showed that the increase in Al within ZnO thin layer increases its band gap energy. The obtained value of band gap energy is very close to the determined oscillation energy. However, the dispersion energy is nearly half of band gap energy value.