Premium
Optoelectronic performance of poly( p ‐phenylenevinylene)‐based heterostructures evaluated by scanning probe techniques
Author(s) -
Čermák Jan,
Rezek Bohuslav,
Cimrová Věra,
Výprachtický Drahomír,
Hörhold HansHeinrich,
Ledinský Martin,
Fejfar Antonín
Publication year - 2009
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.200982255
Subject(s) - materials science , heterojunction , kelvin probe force microscope , raman spectroscopy , atomic force microscopy , optoelectronics , polymer , acceptor , microscopy , thin film , scanning electron microscope , nanotechnology , optics , composite material , physics , condensed matter physics
Thin polymer blend films made of donor and acceptor poly( p ‐phenylenevinylene) (PPV)‐based polymers were prepared. Diverse scanning probe techniques (atomic force microscopy (AFM), Kelvin force microscopy (KFM), current‐sensing AFM (CS‐AFM), and micro‐Raman mapping) are used to characterize morphologic, electronic as well as optoelectronic properties of the heterostructures. Morphologies of the heterostructures are correlated with microscopic and macroscopic electronic response to a broad‐band visible illumination. The data are discussed with respect to photovoltaic applications.