Kekulé pattern on conductance images between two STM probes | Zendy

Nakanishi Takeshi | Zendy; Ando Tsuneya | Zendy

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Kekulé pattern on conductance images between two STM probes

Author(s) -

Nakanishi Takeshi,

Ando Tsuneya

Publication year - 2008

Publication title -

physica status solidi (b)

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.51

H-Index - 109

eISSN - 1521-3951

pISSN - 0370-1972

DOI - 10.1002/pssb.200879563

Subject(s) - zigzag , conductance , scanning tunneling microscope , interference (communication) , quantum tunnelling , chemistry , nanotechnology , condensed matter physics , molecular physics , materials science , physics , computer science , mathematics , geometry , telecommunications , channel (broadcasting)

The conductance image between two probes of scanning‐tunneling‐microscopy (STM) is calculated in a zigzag carbon nanotube within a tight‐binding model and a realistic model for STM probes. A Kekulé‐type pattern usually appears due to interference of states at K and K' points. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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