z-logo
Premium
Interconnection of the parameters obtained from the dielectric spectrum of CaF 2 doped with ErF 3 and YbF 3
Author(s) -
VassilikouDova Aglaia,
KatsikaTsigourakou Vassiliki
Publication year - 2008
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.200743538
Subject(s) - arrhenius equation , activation energy , doping , enthalpy , dielectric , relaxation (psychology) , interconnection , materials science , thermodynamics , analytical chemistry (journal) , condensed matter physics , chemistry , physics , optoelectronics , psychology , social psychology , chromatography , computer network , computer science
A model has been suggested long ago that interconnects point defect parameters with bulk properties. On this basis, the ra‐tio of the migration entropy s m and the migration enthalpy h m should be equal to a bulk quantity. The validity of this prediction is studied here for the migration s m deduced from the pre‐exponential factor τ 0 over the activation energy E involved in the Arrhenius relation τ = τ 0 exp ( E / kT ) for the relaxation time τ . The study is focused on the so called R I ‐relaxation in CaF 2 doped with ErF 3 and YbF 3 . (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom