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Interconnection of the parameters obtained from the dielectric spectrum of CaF 2 doped with ErF 3 and YbF 3
Author(s) -
VassilikouDova Aglaia,
KatsikaTsigourakou Vassiliki
Publication year - 2008
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.200743538
Subject(s) - arrhenius equation , activation energy , doping , enthalpy , dielectric , relaxation (psychology) , interconnection , materials science , thermodynamics , analytical chemistry (journal) , condensed matter physics , chemistry , physics , optoelectronics , psychology , social psychology , chromatography , computer network , computer science
A model has been suggested long ago that interconnects point defect parameters with bulk properties. On this basis, the ra‐tio of the migration entropy s m and the migration enthalpy h m should be equal to a bulk quantity. The validity of this prediction is studied here for the migration s m deduced from the pre‐exponential factor τ 0 over the activation energy E involved in the Arrhenius relation τ = τ 0 exp ( E / kT ) for the relaxation time τ . The study is focused on the so called R I ‐relaxation in CaF 2 doped with ErF 3 and YbF 3 . (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)