Premium
Alignment of the energy levels and charge injection barriers at interfaces for spin injection: La 0.7 Sr 0.3 MnO 3 in contact with organic semiconductors
Author(s) -
Grobosch M.,
Knupfer M.,
Dörr K.,
Gangineni R. B.
Publication year - 2008
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.200743413
Subject(s) - materials science , ultraviolet , organic semiconductor , semiconductor , pulsed laser deposition , dipole , optoelectronics , thin film , analytical chemistry (journal) , nanotechnology , chemistry , organic chemistry , chromatography
For determination of the energy‐level alignment at inter‐ faces between La 0.7 Sr 0.3 MnO 3 films and two typical organic semiconductors, copper‐phthalocyanine (CuPc) and α‐sexithiophene (α‐6T) we have performed a combined X‐ray and ultraviolet photoemission study. La 0.7 Sr 0.3 MnO 3 thin films were grown by using the pulsed laser deposition (PLD) technique and subsequently ex‐situ cleaned before the organic materials were thermally evaporated. We show that under these conditions the interfaces are free from chemical interaction and are characterized by a short‐range interface dipole and large injection barriers. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)