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A method for applying biaxial stress to solids
Author(s) -
Trzeciakowski Witold,
Strzeszewski Jan,
Gębicki Wojciech,
Thebaud JeanMarc
Publication year - 2008
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.200743202
Subject(s) - profilometer , deflection (physics) , materials science , curvature , radius of curvature , optics , radius , raman spectroscopy , composite material , geometry , physics , mathematics , mean curvature , computer security , computer science , mean curvature flow , surface roughness
Abstract Large deformations of materials are achieved by applying gas pressure to thin circular plates. The deflections of the plates are measured using a laser profilometer and the strain in the centre of the plates is determined from the radius of curvature and verified by Raman scattering. The results for Si(100), Si(111) and GaAs(111) are compared with the classical theory for thin plates. The relationship between the applied pressure and the strain in the centre of the plates is simple in the case when the deflection is less than the thickness. For deflections comparable to or exceeding the thickness it is best to perform the measurements on both sides of the plate and look at the differences between them. The method should be useful for determining electron or phonon deformation potentials or for studying biaxial strain effects in one sample. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)