z-logo
Premium
Longitudinal capacitance design for optical left‐handed metamaterials
Author(s) -
Schweizer H.,
Fu L.,
Gräbeldinger H.,
Guo H.,
Liu N.,
Kaiser S.,
Giessen H.
Publication year - 2007
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.200674513
Subject(s) - metamaterial , capacitance , immittance , permittivity , materials science , equivalent circuit , capacitive sensing , electrical impedance , optoelectronics , strips , transmission line , stub (electronics) , negative impedance converter , dielectric , optics , physics , voltage , electronic engineering , electrical engineering , composite material , engineering , electrode , quantum mechanics , voltage source
Transmission line analysis of metamaterials gives clear and simple relations of the immittance Z (longitudinal impedance) and the admittance Y (shunt impedance) with the material parameters of permeability and permittivity, respectively. Beyond numerical analysis methods, TL analysis allows for a characterization of the handedness of lumped elements in the corresponding equivalent circuit. For achieving left‐handed materials, simultaneous negative permittivity and permeability are sufficient. Negative permittivity is normally realized through plasmonic oscillation of electrons in metals. A question remaining in optical left‐handed metamaterials is how to design properly a longitudinal capacitance, which is a left‐handed element indispensable for achieving a negative permeability. We propose a novel approach to design the longitudinal capacitance based on a metallic inductive/capacitive grating structure formed on a ridge patterned dielectric substrate. The fabricated structure shows the expected resonance and confirms the formation of the expected capacitance. Simulations show the possibility to obtain negative indices by adding additional metal strips up to frequencies of 300 THz and beyond, which depends on the structure size. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here