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Photoluminescence microscopy of as‐grown individual single‐walled carbon nanotubes on Si/SiO 2 substrates
Author(s) -
Kiowski Oliver,
Lebedkin Sergei,
Kappes Manfred M.
Publication year - 2006
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.200669127
Subject(s) - photoluminescence , carbon nanotube , materials science , chemical vapor deposition , micrometer , nanotechnology , laser , optical microscope , wavelength , microscopy , optoelectronics , analytical chemistry (journal) , optics , scanning electron microscope , composite material , chemistry , physics , chromatography
We present far‐field photoluminescence (PL) imaging at room temperature of tens of micrometer long individual single‐walled carbon nanotubes (SWNTs) grown and measured directly on a Si/SiO 2 surface. The SWNTs are grown by Chemical Vapour Deposition (CVD) with ethanol as carbon source and contact the surface with their full length. We detect the PL and its variations along SWNTs in a home‐built laser microscope with a spatial resolution of ∼400 nm. We are able to reliably assign ( n , m )‐structure of SWNTs by measuring PL spectra in the range of 800–1600 nm as function of the excitation wavelength varying between 710 and 860 nm. This allows us to check structural integrity (changes of helicity) along the tube. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)