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Special issue: Advanced optical diagnostics of surfaces, nanostructures and ultrathin films
Author(s) -
Esser Norbert
Publication year - 2005
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.200590021
Subject(s) - metalorganic vapour phase epitaxy , epitaxy , scanning tunneling microscope , materials science , nanotechnology , stack (abstract data type) , nanostructure , optoelectronics , optics , layer (electronics) , physics , computer science , programming language
The present special issue of physica status solidi (b) is dedicated to the 65th birthday of Wolfgang Richter, now at University Rome II “Tor Vergata”, and reviews recent achievements in the field of solid state and interface optics on inorganic and organic materials. The cover picture of the issue shows, in the background, a filled state scanning tunneling microscopy (STM) topograph of a GaAs(001)(2 × 4) surface, superimposed by a colour plot of time dependent reflectance anisotropy spectra (RAS). RAS was measured in situ during metal‐organic vapour phase epitaxy (MOVPE) growth of a 6‐fold stack of GaAsN layers on GaAs(001)(2 × 4).

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