Assessment of phonon mode characteristics via infrared spectroscopic ellipsometry on  a ‐plane GaN | Zendy

Darakchieva V. | Zendy; Paskova T. | Zendy; Paskov P. P. | Zendy; Arwin H. | Zendy; Schubert M. | Zendy; Monemar B. | Zendy; Figge S. | Zendy; Hommel D. | Zendy; Haskell B. A. | Zendy; Fini P. T. | Zendy; Nakamura S. | Zendy

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Assessment of phonon mode characteristics via infrared spectroscopic ellipsometry on a ‐plane GaN

Author(s) -

Darakchieva V.,

Paskova T.,

Paskov P. P.,

Arwin H.,

Schubert M.,

Monemar B.,

Figge S.,

Hommel D.,

Haskell B. A.,

Fini P. T.,

Nakamura S.

Publication year - 2006

Publication title -

physica status solidi (b)

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.51

H-Index - 109

eISSN - 1521-3951

pISSN - 0370-1972

DOI - 10.1002/pssb.200565400

Subject(s) - ellipsometry , phonon , infrared , materials science , strain (injury) , infrared spectroscopy , mode (computer interface) , optoelectronics , optics , condensed matter physics , chemistry , nanotechnology , physics , thin film , medicine , organic chemistry , computer science , operating system

Generalized infrared spectroscopic ellipsometry was applied to study the vibrational properties of anisotropically strained a ‐plane GaN films with different thicknesses. We have established a correlation between the phonon mode parameters and the strain, which allows the determination of the deformation potentials and strain‐free frequency of the GaN A 1 (TO) mode. These results are compared with previous theoretical and experimental findings and discussed. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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