Raman and transmission electron microscopy characterization of InN samples grown on GaN/Al 2 O 3  by molecular beam epitaxy | Zendy

Arvanitidis J. | Zendy; Katsikini M. | Zendy; Ves S. | Zendy; Delimitis A. | Zendy; Kehagias Th. | Zendy; Komninou Ph. | Zendy; Dimakis E. | Zendy; Iliopoulos E. | Zendy; Georgakilas A. | Zendy

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Raman and transmission electron microscopy characterization of InN samples grown on GaN/Al 2 O 3 by molecular beam epitaxy

Author(s) -

Arvanitidis J.,

Katsikini M.,

Ves S.,

Delimitis A.,

Kehagias Th.,

Komninou Ph.,

Dimakis E.,

Iliopoulos E.,

Georgakilas A.

Publication year - 2006

Publication title -

physica status solidi (b)

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.51

H-Index - 109

eISSN - 1521-3951

pISSN - 0370-1972

DOI - 10.1002/pssb.200565193

Subject(s) - raman spectroscopy , materials science , transmission electron microscopy , molecular beam epitaxy , epitaxy , dislocation , crystallography , microstructure , electron diffraction , lattice constant , diffraction , analytical chemistry (journal) , optics , chemistry , nanotechnology , composite material , physics , layer (electronics) , chromatography

Raman spectroscopy and transmission electron microscopy were employed to study the vibrational properties and the microstructure of epitaxially grown InN films on GaN/Al 2 O 3 templates. The variations of the InN lattice constants, as deduced by electron diffraction analysis, along with the red‐shifted E 2 2 mode frequency reveal that InN films exhibit residual tensile stress, strongly dependent on the epilayer growth temperature. Threading dislocations are the dominant structural defects in the films, having a density in the order of 10 9 –10 10 cm –2 . Profile analysis of the E 2 2 Raman peak by means of the Spatial Correlation Model provides useful information concerning the effective mean length for free phonon propagation ( L ), which is a measure of the structural quality of the samples. In all the studied samples, L monotonically increases with decreasing threading dislocation density of pure screw and mixed type character. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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