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Correlation between growth and magnetic properties of Fe/Ti multilayers
Author(s) -
Smardz K.,
Smardz L.
Publication year - 2006
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.200562419
Subject(s) - x ray photoelectron spectroscopy , nanocrystalline material , crystallite , coercivity , materials science , phase (matter) , analytical chemistry (journal) , sputter deposition , sputtering , crystallography , nuclear magnetic resonance , condensed matter physics , thin film , metallurgy , chemistry , nanotechnology , physics , organic chemistry , chromatography
Fe/Ti multilayers (MLs) were prepared onto glass substrates at 295 K using UHV RF/DC magnetron sputtering. Planar growth of the Fe and Ti sublayers was confirmed in‐situ by X‐ray photoelectron spectroscopy (XPS). We have observed exponential variation of the XPS Fe‐2p and Ti‐2p integral intensities with increasing sublayer thicknesses. Systematic structural and magnetic studies showed, that iron sublayers grow on Ti in the soft magnetic nanocrystalline phase up to a critical thickness d crit ∼ 2.3 nm. For a thickness greater than d crit , the Fe sublayers undergo a structural transition to the polycrystalline phase with much higher coercivity. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)