Premium
Some remarks on the calculation of the complex refractive index of medium in terahertz reflection spectroscopy
Author(s) -
Gornov Evgeny,
Peiponen KaiErik
Publication year - 2007
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.200541491
Subject(s) - terahertz radiation , refractive index , ellipsometry , optics , reflection (computer programming) , reflection coefficient , spectroscopy , dispersion (optics) , terahertz spectroscopy and technology , materials science , range (aeronautics) , surface roughness , physics , optoelectronics , thin film , computer science , nanotechnology , quantum mechanics , composite material , programming language
This paper presents a technique, based on dispersion theory, for the analysis of terahertz reflection spectroscopy data measured using ellipsometric methods. Formulas for the complex reflection coefficient provide simpler equations than those used in conventional ellipsometry for resolving the complex refractive index in the THz spectral range. It is proposed that a reflection coefficient ratio yields information on the surface roughness when probing a surface by THz radiation. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)