Premium
Effect of dielectric function inhomogeneities on spectral width of Er 3+ ion luminescence in structures of Si nanocrystals
Author(s) -
Teterukov S. A.,
Lisachenko M. G.,
Zhigunov D. M.,
Shalygina O. A.,
Kashkarov P. K.,
Timoshenko V. Yu.
Publication year - 2005
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.200541333
Subject(s) - nanocrystalline material , dielectric , ion , materials science , electric field , photoluminescence , luminescence , nanocrystal , stark effect , dielectric function , spectral line , analytical chemistry (journal) , condensed matter physics , molecular physics , atomic physics , optoelectronics , nanotechnology , chemistry , physics , organic chemistry , chromatography , quantum mechanics , astronomy
Calculations of the Stark‐effect splitting of the energy levels of Er 3+ ions in SiO 2 layers alternating with layers of quasi‐ordered Si‐nanocrystals have been performed. The splitting is caused by the electric field of image charges at the interface between the layers having different dielectric constants. It has been established, that the splitting increases with increasing difference between the dielectric constants of SiO 2 and nanocrystalline layers, and as the ions approach the interface. The results obtained allow us to explain the experimental data on an additional spectral broadening of the Er 3+ photoluminescence line at 0.8 eV with increasing thickness of nanocrystalline Si layers. Moreover, a modeling of the spectral line shape has been performed, assuming that it consists of six components, properties of which depend on the additional electric field induced by dielectric function inhomogeneity. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)