Photoemission study of Eu valency in EuF 3  ultrathin buried layers and single crystals | Zendy

Burian W. | Zendy; Szade J. | Zendy; O’Keevan T. | Zendy; Celiński Z. | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Premium

Photoemission study of Eu valency in EuF 3 ultrathin buried layers and single crystals

Author(s) -

Burian W.,

Szade J.,

O’Keevan T.,

Celiński Z.

Publication year - 2004

Publication title -

physica status solidi (b)

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.51

H-Index - 109

eISSN - 1521-3951

pISSN - 0370-1972

DOI - 10.1002/pssb.200409032

Subject(s) - valency , x ray photoelectron spectroscopy , amorphous solid , valence (chemistry) , single crystal , materials science , oxidation state , photoemission spectroscopy , crystallography , divalent , thin film , analytical chemistry (journal) , chemistry , nanotechnology , chemical engineering , metallurgy , metal , linguistics , organic chemistry , chromatography , engineering , philosophy

X‐ray Photoelectron Spectroscopy was used to investigate Eu valence in the following EuF 3 samples: single crystal, buried MBE layers (Au/EuF 3 /Fe/GaAs and Au/EuF 3 /Fe/Ag/GaAs) and amorphous thin films. Evidence was found for a surface divalent Eu state present on single crystal and amorphous films, while the MBE ultra thin buried layers only exhibited a trivalent Eu state. (© 2004 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here

Accelerating Research