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Photoemission study of Eu valency in EuF 3 ultrathin buried layers and single crystals
Author(s) -
Burian W.,
Szade J.,
O’Keevan T.,
Celiński Z.
Publication year - 2004
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.200409032
Subject(s) - valency , x ray photoelectron spectroscopy , amorphous solid , valence (chemistry) , single crystal , materials science , oxidation state , photoemission spectroscopy , crystallography , divalent , thin film , analytical chemistry (journal) , chemistry , nanotechnology , chemical engineering , metallurgy , metal , linguistics , organic chemistry , chromatography , engineering , philosophy
X‐ray Photoelectron Spectroscopy was used to investigate Eu valence in the following EuF 3 samples: single crystal, buried MBE layers (Au/EuF 3 /Fe/GaAs and Au/EuF 3 /Fe/Ag/GaAs) and amorphous thin films. Evidence was found for a surface divalent Eu state present on single crystal and amorphous films, while the MBE ultra thin buried layers only exhibited a trivalent Eu state. (© 2004 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)