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Pressure induced wavelength dependence of catastrophic optical damage in 980 nm semiconductor diode lasers
Author(s) -
Lock D.,
Sweeney S. J.,
Adams A. R.
Publication year - 2004
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.200405248
Subject(s) - wavelength , laser , materials science , semiconductor , semiconductor laser theory , hydrostatic pressure , diode , optoelectronics , optics , physics , thermodynamics
Catastrophic Optical Damage (COD) occurs when the facet of high power semiconductor lasers melt due to extreme self‐absorption. COD tends to occur in short wavelength lasers but seems to be less of a problem in long wavelength devices. In this paper, we use hydrostatic pressure as a means of changing the wavelength in order to investigate the dependence of COD on emission wavelength. We find that the recorded output power threshold at the onset of COD decreases with increasing pressure (decreasing wavelength). Our measurements further reveal that this threshold is closely correlated with the increase in optical confinement factor with pressure which suggests that the wavelength dependence may largely be attributed to the change in mode size with operating wavelength. (© 2004 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)