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Negative thermal expansion in the layered semiconductor TlGaSe 2
Author(s) -
Abdullayev N. A.,
Mammadov T. G.,
Suleymanov R. A.
Publication year - 2005
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.200402126
Subject(s) - thermal expansion , negative thermal expansion , semiconductor , condensed matter physics , materials science , poisson distribution , poisson's ratio , crystallography , chemistry , composite material , physics , mathematics , optoelectronics , statistics
The nature of negative thermal expansion in the layer plane of the layered semiconductor TlGaSe 2 has been investigated. It is shown that, in contrast to other crystals with a layered structure in which negative linear expansion is observed, the nature of the negative thermal expansion in TlGaSe 2 crystals is due to the large Poisson contraction. The possible explanation of such an effect is discussed. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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