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Application of wavelength‐resolved optically‐detected XAS methods to phase‐segregated silicates
Author(s) -
Poolton N. R. J.,
Pantos E.,
Hamilton B.,
Denby P. M.,
Johnsen O.
Publication year - 2004
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.200402112
Subject(s) - aluminosilicate , phase (matter) , wavelength , materials science , absorption (acoustics) , x ray absorption spectroscopy , optics , absorption spectroscopy , optoelectronics , chemistry , physics , composite material , biochemistry , organic chemistry , catalysis
Wavelength‐resolved optically‐detected X‐ray absorption experiments are described that monitor the emission from naturally occurring phase‐exsolved aluminosilicate feldspars, when exciting across the Ca and K L 2,3 core levels. The results from a selection of example cases are presented that demonstrate the power of the technique in examining the structural and optical properties of phase segregated materials that could not easily be achievable by other methods. The results highlight that in these materials, extrinsic point defects such as Mn 2+ and Fe 3+ can also become preferentially associated with particular exsolved phases. (© 2004 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)