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Interfacial diffusion in Fe/Cr multilayers studied by synchrotron X‐ray techniques
Author(s) -
Cho Tae Sik,
Yi Min Su,
Doh Seok Joo,
Je Jung Ho,
Noh Do Young
Publication year - 2004
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.200304518
Subject(s) - synchrotron , extended x ray absorption fine structure , diffusion , x ray reflectivity , materials science , scattering , x ray , analytical chemistry (journal) , absorption (acoustics) , crystallography , surface finish , synchrotron radiation , small angle x ray scattering , chemistry , optics , absorption spectroscopy , thin film , metallurgy , nanotechnology , composite material , physics , thermodynamics , chromatography
Abstract We have studied the interfacial diffusion of Fe/Cr multilayers using synchrotron X‐ray techniques, such as X‐ray reflectivity, extended X‐ray absorption fine structures (EXAFS), and high‐resolution X‐ray scattering. The results of X‐ray reflectivity indicated that the interfacial roughness of Fe/Cr multilayers increases with the Cr‐layer thickness. The Fourier transform (FT) of EXAFS data clearly showed that the Fe atoms dominantly diffuse into the stable Cr layers at the Fe/Cr interface. The results of high‐resolution X‐ray scattering supported the interfacial diffusion of Fe atoms. Our study revealed that the dominantly interfacial diffusion of Fe atoms into the Cr layers effects the interfacial roughness of the Fe/Cr multilayers. (© 2004 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)