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Crystal field analysis of erbium doped yttrium oxide thin films in C 2 and C 3 i sites
Author(s) -
Dammak M.,
Maalej R.,
Kamoun M.,
Deschanvres J.L.
Publication year - 2003
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.200301822
Subject(s) - yttrium , crystal (programming language) , erbium , fluorescence , analytical chemistry (journal) , doping , ion , thin film , materials science , field (mathematics) , crystal field theory , infrared , oxide , chemistry , physics , optics , nanotechnology , optoelectronics , pure mathematics , metallurgy , programming language , organic chemistry , mathematics , chromatography , computer science
Fluorescence measurements on Er ions in Y 2 O 3 thin films have been analyzed with crystal‐field Hamiltonians of C 2 and C 3 i symmetries including J ‐mixing effects. Crystal‐field parameters have been determined based on the Racah theory, that minimize the rms deviation between calculated and experimentally found energy. This theoretical analysis confirms the dominance of the C 2 symmetry site in the fluorescence spectrum; however in the infrared emission spectrum, the contribution of the two sites C 2 and C 3 i is comparable.