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Optical Modulation Spectra of Selenium and Their Dependence on the Uniaxial Stress
Author(s) -
Tuomi T. O.
Publication year - 1970
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.19700380213
Subject(s) - wavelength , spectral line , selenium , photon energy , perpendicular , stress (linguistics) , reflectivity , materials science , optics , exciton , modulation (music) , molecular physics , chemistry , atomic physics , photon , physics , condensed matter physics , linguistics , philosophy , geometry , mathematics , astronomy , acoustics , metallurgy
Wavelength‐ and stress‐modulated reflectance and transmission spectra of selenium are measured at 77 °K in the photon energy range from 1.7 to 3.7 eV. New structure is discovered, e.g. a peak at 2.0 eV in the wavelength‐modulated reflectance spectrum with light polarized parallel to the [0001] direction. Unusually large linear stress coefficients of the peaks are found. The stress coefficient of the sharp exciton peak at 1.97 eV in the wavelength‐modulated reflectance spectrum with light polarized perpendicular to [0001] is +(2.5 ± 0.4) × 10 −11 eV cm 2 dyn −1 for the uniaxial compression along the [0001] direction, and −(6.7 ± 0.5) × 10 −11 eV cm 2 dyn −1 for the compression along [1000].