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Two‐Dimensional Comparison of Electron Micrographs with Computer Calculations
Author(s) -
Spring M. S.,
Steeds J. W.
Publication year - 1970
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.19700370134
Subject(s) - micrograph , electron micrographs , lattice (music) , electron microscope , electron , acceleration voltage , atomic physics , cathode ray , physics , materials science , chemistry , optics , scanning electron microscope , quantum mechanics , acoustics
Two methods of displaying two‐dimensional intensity data are developed and used to compare many‐beam dynamical theory calculations with electron micrographs. The effect of different published values of the real lattice potential is investigated and for Cu‐10 at% Al the following values of the imaginary lattice potential V ′ g were obtained, expressed in terms of U ′ g = 2 me V ′ g / h 2 : U ′ 111 / U 111 = 0.0275 ± 0.0025, U ′ 0 / U 111 = 0.0358 ± 0.0026, U ′ 0 = 0.007 ± 0.0005 Å −2 . The many‐beam effects at high microscope accelerating voltages are considered.
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