Premium
Investigations into Ripple Wavelength in Evaporated Thin Films by Lorentz Microscopy
Author(s) -
Suzuki T.
Publication year - 1970
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.19700370113
Subject(s) - ripple , wavelength , lorentz transformation , materials science , substrate (aquarium) , optics , microscopy , thin film , alloy , condensed matter physics , physics , nanotechnology , thermodynamics , quantum mechanics , composite material , power (physics) , oceanography , geology
A systematic experimental study of ripple wavelength by Lorentz microscopy in NiFe alloy films was carried out. The following should be noted: 1. The only possible way to determine experimentally a meaningful wavelength is to evaluate visually well‐defined ripple high‐contrast lines on a photomicrograph. 2. The average wavelength determined in this way is of the order of 1 μm. This value is in reasonable agreement with the main wavelength predicted by the theories developed by others. However, the predicted slight dependence of this observed wavelength on substrate deposition temperature and alloy composition was not observed. On the other hand, the strong dependence of the measured wavelength on the external magnetic fields is in good agreement with that predicted theoretically.