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Peak Effect in Type II Superconductors: Yield Point of the Fluxon Lattice
Author(s) -
Chang C. C.,
McKin J. B.,
RoseInnes A. C.
Publication year - 1969
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.19690360122
Subject(s) - fluxon , condensed matter physics , shearing (physics) , superconductivity , dislocation , materials science , lattice (music) , flow stress , voltage , flux pinning , type ii superconductor , critical current , physics , josephson effect , composite material , pi josephson junction , strain rate , quantum mechanics , acoustics
The complicated current‐voltage (flux flow) curves obtained from type II superconductors which show the peak effect are compared to the stress‐strain curves of crystalline materials in which plastic flow at low stresses is prevented by pinning of dislocations. It is suggested that the unstable step in the current‐voltage characteristic is the result of “yield” and subsequent shearing of the fluxon lattice by dislocation motion.

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