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Resistance Measurements of the Kinetics of the Elastic After‐Effect in AuCu (75, 25) and AgZn (69, 31)
Author(s) -
Chardon J. Th.,
Radelaar S.
Publication year - 1969
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.19690330145
Subject(s) - kinetics , relaxation (psychology) , zener diode , materials science , thermodynamics , chemistry , mathematics , physics , medicine , classical mechanics , quantum mechanics , voltage , resistor
The kinetics of the elastic after‐effect (Zener relaxation‐effect) in AuCu (75,25) and AgZn (69,31) is studied by measuring the resistance changes accompanying the elastic after‐effect. The results of this method are compared with data obtained by more conventional techniques.