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Thermal Expansion of Silicon and Zinc Oxide (II)
Author(s) -
Ibach H.
Publication year - 1969
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.19690330124
Subject(s) - thermal expansion , zinc , pyroelectricity , wurtzite crystal structure , materials science , thermal , thermodynamics , capacitance , silicon , oxide , composite material , chemistry , physics , metallurgy , dielectric , optoelectronics , electrode , ferroelectricity
Coefficients of thermal expansion α‖ c and α ⊥ c between 4 and 800°K have been measured for zinc oxide using an interferometric and a capacitance method. Thermal properties of wurtzite lattices (two coefficients of thermal expansion and a pyroelectric constant) can be described in terms of three thermal equations of state. Two mechanical and one electrical Grüneisen parameters are defined and their temperature dependence is calculated from experimental results. The high‐ and low‐temperature limits of the Grüneisen parameters are compared with results obtained in other experiments. The values predicted from a rigid ion model are discussed.