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The Dependence of Extinction Distance on Deviation from the Bragg Condition in Silicon
Author(s) -
Cann C. D.,
Sheinin S. S.
Publication year - 1968
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.19680300239
Subject(s) - reflection (computer programming) , beam (structure) , bragg's law , optics , extinction (optical mineralogy) , silicon , scattering , physics , materials science , computational physics , diffraction , optoelectronics , programming language , computer science
Abstract The dependence of the (111) and (220) extinction distances in silicon on deviation from the exact Bragg condition has been investigated. The results obtained for the (220) reflection show good agreement with both the two‐beam and multi‐beam dynamical theories. For the (111) reflection, however, the results are in poor agreement with the two‐beam theory and in only partial agreement with the multi‐beam theory. The agreement with the multi‐beam theory is improved when electron scattering factors obtained from recent X‐ray measurements are employed in the multi‐beam calculations.