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Thickness Dependence of Conductivity due to the Polycrystalline Structure in Evaporated CdS Thin Films
Author(s) -
Berger H.,
Kahle W.,
Jäniche G.
Publication year - 1968
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.19680280246
Subject(s) - library science , engineering physics , physics , materials science , computer science
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