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The Fine Structure of Spots in Electron Diffraction Resulting from the Presence of Planar Interfaces and Dislocations. III. Domain Boundaries
Author(s) -
Gevers R.,
van Landuyt J.,
Amelinckx S.
Publication year - 1968
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.19680260222
Subject(s) - diffraction , perpendicular , planar , optics , transmission electron microscopy , domain (mathematical analysis) , electron diffraction , electron , multiplicity (mathematics) , physics , fourier transform , molecular physics , materials science , geometry , mathematics , mathematical analysis , computer graphics (images) , quantum mechanics , computer science
The fine structure of electron diffraction spots caused by the presence of domain boundaries (δ‐boundaries) is derived theoretically. The same method is used as in part I, namely the Fourier transforms of the transmitted and scattered intensities are calculated and discussed. The predicted fine structure consists in a fourfold splitting of the scattered as well as of the transmitted beams in a direction perpendicular to the interface. It is shown that the relative intensities and the spacing of the spots in this quadruplet are strongly influenced by the anomalous absorption and by parameters such as e.g. Δ s and s . The effect of domain boundaries on the multiplicity and nature of the splitting is discussed. Finally the relation between the constituent beams and the fringe pattern visible in transmission electron microscopy at domain boundaries is analysed. Excellent agreement is found with the pattern characteristics previously derived from the analytical discussion of the transmitted and scattered intensities.